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doi:10.22028/D291-29265
Title: | Introduction to the Proceedings of CISCEM 2018 - the 4th Conference on In-Situ and Correlative Electron Microscopy |
Author(s): | de Jonge, Niels Mølhave, Kristian Alloyeau, Damien |
Language: | English |
Title: | Microscopy and Microanalysis |
Volume: | 25 |
Issue: | S1 |
Startpage: | 1 |
Endpage: | 2 |
Publisher/Platform: | Cambridge University Press |
Year of Publication: | 2019 |
Publikation type: | Journal Article |
DOI of the first publication: | 10.1017/S1431927618015763 |
Link to this record: | hdl:20.500.11880/28140 http://dx.doi.org/10.22028/D291-29265 |
ISSN: | 1435-8115 1431-9276 |
Date of registration: | 21-Oct-2019 |
Faculty: | NT - Naturwissenschaftlich- Technische Fakultät |
Department: | NT - Physik |
Professorship: | NT - Keiner Professur zugeordnet |
Collections: | SciDok - Der Wissenschaftsserver der Universität des Saarlandes |
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