Please use this identifier to cite or link to this item:
doi:10.22028/D291-24129
Title: | Dielectric measurements of silica aerogels |
Author(s): | Dos Santos, Dayse Iara Ziemath, Ervino C. Silva, A. A. Basso, H. C. Aegerter, Michel A. |
Language: | English |
Year of Publication: | 1987 |
OPUS Source: | Crystal lattice defects and amorphous materials. - 15. 1987, S. 381-385 |
SWD key words: | Messwert Aerogel Heliumatom Kondensation Verflüssigung |
DDC notations: | 500 Science |
Publikation type: | Journal Article |
Abstract: | The dielectric response of aerogels of silica is measured down to 1.7 K and compared to a theoretical calculation using the Looyenga's relation applied to two different model structures. Helium atoms start to condense on the pore walls at T — 13K and fill them at the liquefaction temperature. A drop of the dielectric constant accompanied by a large loss peak is observed near 35K. The origin of the absorption lies in a thermally activated relaxation process and is probably due to a large number of structural defects similar to those proposed for bulk silica. |
Link to this record: | urn:nbn:de:bsz:291-scidok-22721 hdl:20.500.11880/24185 http://dx.doi.org/10.22028/D291-24129 |
Date of registration: | 6-Aug-2009 |
Faculty: | SE - Sonstige Einrichtungen |
Department: | SE - INM Leibniz-Institut für Neue Materialien |
Collections: | INM SciDok - Der Wissenschaftsserver der Universität des Saarlandes |
Files for this record:
File | Description | Size | Format | |
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aeg092.pdf | 2,12 MB | Adobe PDF | View/Open |
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