Please use this identifier to cite or link to this item:
doi:10.22028/D291-24078
Title: | Study of Vk centers in CsI crystals |
Author(s): | Sidler, T. Pellaux, J. P. Nouailhat, A. Aegerter, Michel A. |
Language: | English |
Year of Publication: | 1973 |
OPUS Source: | Solid state communications. - 13. 1973, 4, S. 479-482 |
SWD key words: | Thermolumineszenz Iodide Kristall-Engineering |
DDC notations: | 500 Science |
Publikation type: | Journal Article |
Abstract: | Vk centers were observed in CsI doped with Na+ and Tl+ after x-ray irradiation at liquid He temperature by using optical and EPR techniques. They are oriented along [100] directions. By studying thermoluminescence, 2 types of thermal migration were found, one due to linear displacement of the centers along the cubic axis and the other due to 90° rotations. They correspond to 2 glow peaks at 60 and 90°K, respectively. |
Link to this record: | urn:nbn:de:bsz:291-scidok-22243 hdl:20.500.11880/24134 http://dx.doi.org/10.22028/D291-24078 |
Date of registration: | 16-Jul-2009 |
Faculty: | SE - Sonstige Einrichtungen |
Department: | SE - INM Leibniz-Institut für Neue Materialien |
Collections: | INM SciDok - Der Wissenschaftsserver der Universität des Saarlandes |
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File | Description | Size | Format | |
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aeg031.pdf | 259,94 kB | Adobe PDF | View/Open |
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