Please use this identifier to cite or link to this item:
doi:10.22028/D291-24062
Title: | Photothermal deflection spectroscopy for ultra trace analysis of cobalt and copper ions |
Author(s): | De Paula, Mauro H. Aegerter, Michel A. |
Language: | English |
Year of Publication: | 1986 |
OPUS Source: | Analytical letters. - 19. 1986, 3/4, S. 251-265 |
SWD key words: | Spurenanalyse Optothermische Spektroskopie Cobalt Kupfer |
DDC notations: | 500 Science |
Publikation type: | Journal Article |
Abstract: | Photothermal deflection spectroscopy was applied for the abs. detn. At room temp. of ultra trace concn. of Co and Cu ions in aq. soln. The samples were prepd. by percolating 2 L of soln. prepd. from Merck Titrisol Stds. in 200 mg Merck-I cation-exchange resin. With the present exptl. conditions, the detection limit is 20 ppb for Cu and 200 ppb for Co ions within an overall accuracy of 5%. The response of the spectrometer was calibrated by using the inductively coupled plasma technique. |
Link to this record: | urn:nbn:de:bsz:291-scidok-22624 hdl:20.500.11880/24118 http://dx.doi.org/10.22028/D291-24062 |
Date of registration: | 3-Jul-2009 |
Faculty: | SE - Sonstige Einrichtungen |
Department: | SE - INM Leibniz-Institut für Neue Materialien |
Collections: | INM SciDok - Der Wissenschaftsserver der Universität des Saarlandes |
Files for this record:
File | Description | Size | Format | |
---|---|---|---|---|
aeg080.pdf | 370,26 kB | Adobe PDF | View/Open |
Items in SciDok are protected by copyright, with all rights reserved, unless otherwise indicated.